JIS K 0081:2012 - $87.00   BUY NOW

Method for determination of boron in flue gas

JIS K 0081:2012 Publication Description:

Abstract Unavailable

International Classification for Standards (ICS)

ICS Classification Field ICS Field Sub-Group and Number
ICS-13-Environment ICS Stationary Source Emissions (13.040.40)
ICS-71-Chemical ICS Chemical Analysis (71.040.40)

ICS Related Standards

Cart Document Number Document Title
$103.00 ISO 10155:1995 Stationary source emissions - Automated monitoring of mass concentrations of particles - Performance characteristics, test methods and specifications
$138.00 ISO 10396:2007 Stationary source emissions - Sampling for the automated determination of gas emission concentrations for permanently-installed monitoring systems
$138.00 ISO 10397:1993 Stationary source emissions - Determination of asbestos plant emissions - Method by fibre count measurement
$138.00 ISO 10780:1994 Stationary source emissions - Measurement of velocity and volume flowrate of gas streams in ducts
$138.00 ISO 10849:1996 Stationary source emissions - Determination of the mass concentration of nitrogen oxides - Performance characteristics of automated measuring systems
$162.00 ISO 11042-1:1996 Gas turbines - Exhaust gas emission - Part 1: Measurement and evaluation
$103.00 ISO 11042-2:1996 Gas turbines - Exhaust gas emission - Part 2: Automated emission monitoring
$162.00 ISO 11057:2011 Air quality - Test method for filtration characterization of cleanable filter media
$138.00 ISO 11338-1:2003 Stationary source emissions - Determination of gas and particle-phase polycyclic aromatic hydrocarbons - Part 1: Sampling
$138.00 ISO 11338-2:2003 Stationary source emissions - Determination of gas and particle-phase polycyclic aromatic hydrocarbons - Part 2: Sample preparation, clean-up and determination
$103.00 ISO 11564:1998 Stationary source emissions - Determination of the mass concentration of nitrogen oxides - Naphthylethylenediamine photometric method
$103.00 ISO 11632:1998 Stationary source emissions - Determination of mass concentration of sulfur dioxide - Ion chromatography method
$103.00 ISO 12039:2001 Stationary source emissions -- Determination of carbon monoxide, carbon dioxide and oxygen -- Performance characteristics and calibration of automated measuring systems
$185.00 ISO 12141:2002 Stationary source emissions - Determination of mass concentration of particulate matter (dust) at low concentrations - Manual gravimetric method
$162.00 ISO 13199:2012 Stationary source emissions - Determination of total volatile organic compounds (TVOCs) in waste gases from non-combustion processes - Non-dispersive infrared analyser equipped with catalytic converter
$185.00 ISO 13271:2012 Stationary source emissions - Determination of PM10/PM2,5 mass concentration in flue gas - Measurement at higher concentrations by use of virtual impactors
$185.00 ISO 13833:2013 Stationary source emissions - Determination of the ratio of biomass (biogenic) and fossil-derived carbon dioxide - Radiocarbon sampling and determination
$103.00 ISO 14164:1999 Stationary source emissions -- Determination of the volume flowrate of gas streams in ducts -- Automated method
$162.00 ISO 14385-1:2014 Stationary source emissions - Greenhouse gases - Part 1: Calibration of automated measuring systems
$162.00 ISO 14385-2:2014 Stationary source emissions - Greenhouse gases - Part 2: Ongoing quality control of automated measuring systems
$103.00 ISO 15713:2006 Stationary source emissions - Sampling and determination of gaseous fluoride content
$232.00 ISO 16911-1:2013 Stationary source emissions - Manual and automatic determination of velocity and volume flow rate in ducts - Part 1: Manual reference method
$209.00 ISO 16911-2:2013 Stationary source emissions - Manual and automatic determination of velocity and volume flow rate in ducts - Part 2: Automated measuring systems
$185.00 ISO 17179:2016 Stationary source emissions - Determination of the mass concentration of ammonia in flue gas - Performance characteristics of automated measuring systems
$138.00 ISO 17211:2015 Stationary source emissions - Sampling and determination of selenium compounds in flue gas
$138.00 ISO 18466:2016 Stationary source emissions - Determination of the biogenic fraction in CO2 in stack gas using the balance method
$162.00 ISO 21258:2010 Stationary source emissions - Determination of the mass concentration of dinitrogen monoxide (N2O) - Reference method: Non-dispersive infrared method
$185.00 ISO 23210:2009 Stationary source emissions - Determination of PM10/PM2,5 mass concentration in flue gas - Measurement at low concentrations by use of impactors
$103.00 ISO 25139:2011 Stationary source emissions - Manual method for the determination of the methane concentration using gas chromatography
$162.00 ISO 25140:2010 Stationary source emissions - Automatic method for the determination of the methane concentration using flame ionisation detection (FID)
$209.00 ISO 25597:2013 Stationary source emissions - Test method for determining PM2,5 and PM10 mass in stack gases using cyclone samplers and sample dilution
$45.00 ISO 7934:1989 Stationary source emissions - Determination of the mass concentration of sulfur dioxide - Hydrogen peroxide/barium perchlorate/Thorin method
$19.00 ISO 7934/AMD1:1998 Amendment 1 to ISO 7934:1989
$68.00 ISO 7935:1992 Stationary source emissions - Determination of the mass concentration of sulfur dioxide - Performance characteristics of automated measuring methods
$185.00 ISO 9096:2003 Stationary source emissions - Manual determination of mass concentration of particulate matter
$107.00 JIS A 1901:2015 Determination of the emission of volatile organic compounds and aldehydes by building products -- Small chamber method
$90.00 JIS A 1901:2009 Determination of the emission of volatile organic compounds and aldehydes for building products -- Small chamber method
$107.00 JIS B 7982:2002 Automated measuring systems and analyzers for nitrogen oxides in flue gas
$58.00 JIS K 0086:1998 Methods for determination of phenols in flue gas
$49.00 JIS K 0088:1997 Methods for determination of benzene in flue gas
$39.00 JIS K 0089:1998 Methods for determination of acrolein in flue gas
$49.00 JIS K 0090:1998 Method for determination of phosgene in flue gas
$39.00 JIS K 0091:1998 Methods for determination of carbon disulfide in flue gas
$49.00 JIS K 0092:1998 Methods for determination of mercaptan in flue gas
$107.00 JIS K 0095:1999 Methods for sampling of flue gas
$26.00 JIS K 0098:1998 Methods for determination of carbon monoxide in flue gas
$68.00 JIS K 0099:2004 Methods for determination of ammonia in flue gas
$107.00 JIS K 0103:2011 Methods for determination of sulfur oxides in flue gas
$107.00 JIS K 0104:2011 Methods for determination of nitrogen oxides in flue gas
$107.00 JIS K 0105:2012 Methods for determination of fluorine compounds in flue gas
$49.00 JIS K 0222:1997 Methods for determination of mercury in stack gas
$97.00 JIS K 0301:2016 Methods for determination of oxygen in flue gas
$42.00 JIS K 0301:1998 Methods for determination of oxygen in flue gas
$39.00 JIS K 0305:1997 Methods for determination of trichloroethylene and tetrachloroethylene in flue gas
$136.00 JIS K 0311:2005 Method for determination of tetra-through octachlorodibenzo-p-dioxins, tetra-through octachlorodibenzofurans and dioxin-like polychlorinatedbiphenyls in stationary source emissions
$68.00 JIS K 0098:2016 Methods for determination of carbon monoxide in flue gas
$185.00 ISO 9096:2017 Stationary source emissions - Manual determination of mass concentration of particulate matter
$162.00 ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
$138.00 ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
$162.00 ISO 11505:2012 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
$138.00 ISO 11775:2015 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
$209.00 ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
$103.00 ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
$103.00 ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
$68.00 ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
$138.00 ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
$185.00 ISO 13424:2013 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis
$138.00 ISO/TS 14167:2003 Gas analysis - General quality assurance aspects in the use of calibration gas mixtures - Guidelines
$185.00 ISO/TR 14187:2011 Surface chemical analysis - Characterization of nanostructured materials
$138.00 ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
$103.00 ISO 14606:2015 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
$123.00 ISO 14606:2000 Surface chemical analysis -- Sputter depth profiling -- Optimization using layered systems as reference materials
$103.00 ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
$138.00 ISO 14706:2014 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
$139.00 ISO 14706:2000 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
$68.00 ISO 14707:2015 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
$88.00 ISO 14707:2000 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
$209.00 ISO 14912:2003 Gas analysis - Conversion of gas mixture composition data
$103.00 ISO 14975:2000 Surface chemical analysis -- Information formats
$185.00 ISO 14976:1998 Surface chemical analysis -- Data transfer format
$138.00 ISO/TS 15338:2009 Surface chemical analysis - Glow discharge mass spectrometry (GD-MS) - Introduction to use
$45.00 ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
$45.00 ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
$51.00 ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
$162.00 ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
$162.00 ISO 15796:2005 Gas analysis - Investigation and treatment of analytical bias
$68.00 ISO/TR 15969:2001 Surface chemical analysis - Depth profiling - Measurement of sputtered depth
$103.00 ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
$68.00 ISO 16242:2011 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
$68.00 ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
$138.00 ISO/TR 16268:2009 Surface chemical analysis - Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
$162.00 ISO 16413:2013 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
$103.00 ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
$103.00 ISO 16664:2004 Gas analysis - Handling of calibration gases and gas mixtures - Guidelines
$185.00 ISO 16962:2017 Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
$162.00 ISO 16962:2005 Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
$103.00 ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
$103.00 ISO 17331:2004 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
$19.00 ISO 17331/Amd1:2010 Amendment 1 to ISO 17331
$68.00 ISO 17560:2014 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
$88.00 ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
$138.00 ISO 17862:2013 Surface chemical analysis - Secondary ion mass spectrometry - Linearity of intensity scale in single ion counting time-of-flight mass analysers
$68.00 ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
$88.00 ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
$162.00 ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
$45.00 ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
$232.00 ISO 18115-1:2013 Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy
$185.00 ISO 18115-2:2013 Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy
$103.00 ISO 18116:2005 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
$68.00 ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
$138.00 ISO 18118:2015 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
$149.00 ISO 18118:2004 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
$68.00 ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
$68.00 ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
$138.00 ISO/TR 18394:2016 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
$123.00 ISO/TR 18394:2006 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
$162.00 ISO/TS 18507:2015 Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
$138.00 ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
$103.00 ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
$68.00 ISO 19229:2015 Gas analysis - Purity analysis and the treatment of purity data
$68.00 ISO 19318:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
$232.00 ISO/TR 19319:2013 Surface chemical analysis - Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
$138.00 ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
$45.00 ISO 20341:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
$103.00 ISO 20903:2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
$103.00 ISO 21079-1:2008 Chemical analysis of refractories containing alumina, zirconia and silica - Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents and dissolution
$103.00 ISO 21079-2:2008 Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
$103.00 ISO 21079-3:2008 Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrophotometry (FAAS (TITLE TRUNCATED)
$103.00 ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
$68.00 ISO 22048:2004 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
$103.00 ISO/TR 22335:2007 Surface chemical analysis - Depth profiling - Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
$138.00 ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
$68.00 ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
$103.00 ISO 24236:2005 Surface chemical analysis - Auger electron spectroscopy - Repeatability and constancy of intensity scale
$68.00 ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
$185.00 ISO/TS 25138:2010 Surface chemical analysis - Analysis of metal oxide films by glow-discharge optical-emission spectrometry
$51.00 ISO 2590:1973 General method for the determination of arsenic -- Silver diethyldithiocarbamate photometric method
$88.00 ISO 2718:1974 Standard layout for a method of chemical analysis by gas chromatography
$103.00 ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
$162.00 ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
$103.00 ISO/TS 29041:2008 Gas mixtures - Gravimetric preparation - Mastering correlations in composition
$138.00 ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
$45.00 ISO 3165:1976 Sampling of chemical products for industrial use -- Safety in sampling
$88.00 ISO 5790:1979 Inorganic chemical products for industrial use -- General method for determination of chloride content -- Mercurimetric method
$68.00 ISO 6141:2015 Gas analysis - Contents of certificates for calibration gas mixtures
$88.00 ISO 6141:2000 Gas analysis -- Requirements for certificates for calibration gases and gas mixtures
$200.00 ISO 6142:2001 Gas analysis -- Preparation of calibration gas mixtures -- Gravimetric method
$185.00 ISO 6142-1:2015 Gas analysis - Preparation of calibration gas mixtures - Part 1: Gravimetric method for Class I mixtures
$22.00 ISO 6142/Amd1:2009 Gas analysis - Preparation of calibration gas mixtures - Weighing methods - Amendment 1: Liquid introduction
$162.00 ISO 6143:2001 Gas analysis -- Comparison methods for determining and checking the composition of calibration gas mixtures
$162.00 ISO 6144:2003 Gas analysis - Preparation of calibration gas mixtures - Static volumetric method
$162.00 ISO 6145-1:2003 Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 1: Methods of calibration
$103.00 ISO 6145-10:2002 Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 10: Permeation method
$103.00 ISO 6145-11:2005 Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 11: Electrochemical generation
$162.00 ISO 6145-2:2014 Gas analysis - Preparation of calibration gas mixtures using dynamic methods - Part 2: Piston pumps
$77.00 ISO 6145-2:2001 Gas analysis -- Preparation of calibration gas mixtures using dynamic volumetric methods -- Part 2: Volumetric pumps
$103.00 ISO 6145-4:2004 Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 4: Continuous syringe injection method
$103.00 ISO 6145-5:2009 Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 5: Capillary calibration devices
$68.00 ISO 6145-6:2003 Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 6: Critical orifices
$103.00 ISO 6145-7:2009 Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 7: Thermal mass-flow controllers
$138.00 ISO 6145-8:2005 Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 8: Diffusion method
$103.00 ISO 6145-9:2009 Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 9: Saturation method
$68.00 ISO 6206:1979 Chemical products for industrial use -- Sampling -- Vocabulary
$68.00 ISO 6227:1982 Chemical products for industrial use -- General method for determination of chloride ions -- Potentiometric method
$68.00 ISO 6228:1980 Chemical products for industrial use -- General method for determination of traces of sulphur compounds, as sulphate, by reduction and titrimetry
$51.00 ISO 6382:1981 General method for determination of silicon content -- Reduced molybdosilicate spectrophotometric method
$51.00 ISO 6685:1982 Chemical products for industrial use -- General method for determination of iron content -- 1,10-Phenanthroline spectrophotometric method
$103.00 ISO 7504:2015 Gas analysis - Vocabulary
$173.00 ISO 7504:2001 Gas analysis - Vocabulary
$45.00 ISO 758:1976 Liquid chemical products for industrial use -- Determination of density at 20 degrees C
$45.00 ISO 759:1981 Volatile organic liquids for industrial use -- Determination of dry residue after evaporation on water bath -- General method
$68.00 ISO 760:1978 Determination of water -- Karl Fischer method (General method)
$138.00 ISO 78-2:1999 Chemistry -- Layouts for standards -- Part 2: Methods of chemical analysis
$162.00 ISO 8213:1986 Chemical products for industrial use -- Sampling techniques -- Solid chemical products in the form of particles varying from powders to coarse lumps
$68.00 ISO 918:1983 Volatile organic liquids for industrial use -- Determination of distillation characteristics
$107.00 JIS A 1901:2015 Determination of the emission of volatile organic compounds and aldehydes by building products -- Small chamber method
$90.00 JIS A 1901:2009 Determination of the emission of volatile organic compounds and aldehydes for building products -- Small chamber method
$49.00 JIS B 7951:2004 Continuous analyzer for carbon monoxide in ambient air
$107.00 JIS B 7982:2002 Automated measuring systems and analyzers for nitrogen oxides in flue gas
$68.00 JIS K 0068:2001 Test methods for water content of chemical products
$58.00 JIS K 0086:1998 Methods for determination of phenols in flue gas
$49.00 JIS K 0088:1997 Methods for determination of benzene in flue gas
$39.00 JIS K 0089:1998 Methods for determination of acrolein in flue gas
$49.00 JIS K 0090:1998 Method for determination of phosgene in flue gas
$39.00 JIS K 0091:1998 Methods for determination of carbon disulfide in flue gas
$49.00 JIS K 0092:1998 Methods for determination of mercaptan in flue gas
$107.00 JIS K 0093:2006 Testing methods for polychlorobiphenyl in industrial water and wastewater
$107.00 JIS K 0095:1999 Methods for sampling of flue gas
$26.00 JIS K 0098:1998 Methods for determination of carbon monoxide in flue gas
$68.00 JIS K 0099:2004 Methods for determination of ammonia in flue gas
$107.00 JIS K 0103:2011 Methods for determination of sulfur oxides in flue gas
$107.00 JIS K 0104:2011 Methods for determination of nitrogen oxides in flue gas
$107.00 JIS K 0105:2012 Methods for determination of fluorine compounds in flue gas
$68.00 JIS K 0122:1997 General rules for ion selective electrode method
$107.00 JIS K 0133:2007 General rules for high frequency plasma mass spectrometry
$155.00 JIS K 0150:2009 Surface chemical analysis -- Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
$49.00 JIS K 0222:1997 Methods for determination of mercury in stack gas
$68.00 JIS K 0225:2002 Testing methods for determination of trace components in diluent gas and zero gas
$97.00 JIS K 0301:2016 Methods for determination of oxygen in flue gas
$42.00 JIS K 0301:1998 Methods for determination of oxygen in flue gas
$39.00 JIS K 0305:1997 Methods for determination of trichloroethylene and tetrachloroethylene in flue gas
$136.00 JIS K 0311:2005 Method for determination of tetra-through octachlorodibenzo-p-dioxins, tetra-through octachlorodibenzofurans and dioxin-like polychlorinatedbiphenyls in stationary source emissions
$49.00 JIS K 0557:1998 Water used for industrial water and wastewater analysis
$87.00 JIS K 0804:2014 Gas detector tube measurement system (Length-of-stain type)
$39.00 JIS K 0806:1997 Automatic chemical oxygen demand meter
$58.00 JIS Z 8802:2011 Methods for determination of pH of aqueous solutions
$68.00 JIS K 0098:2016 Methods for determination of carbon monoxide in flue gas
$138.00 ISO 12963:2017 Gas analysis - Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
$45.00 ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
$103.00 ISO 16664:2017 Gas analysis - Handling of calibration gases and gas mixtures - Guidelines
$138.00 ISO 19668:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Estimating and reporting detection limits for elements in homogeneous materials
$162.00 ISO 6145-6:2017 Gas analysis - Preparation of calibration gas mixtures using dynamic methods - Part 6: Critical flow orifices