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Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)

ASTM Volume 10.04 Electronics, Declarable Substances in Materials

F769-00 Publication Description:

Abstract Unavailable

International Classification for Standards (ICS)

ICS Classification Field ICS Field Sub-Group and Number
ICS-31-Electronics ICS Diodes (31.080.10)
ICS-31-Electronics ICS Transistors (31.080.30)

ICS Related Standards

Cart Document Number Document Title
$55.20 F528-99(2005) Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011)
$55.20 F528-99 Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors
$55.20 F617-00 Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)