F71-68(1999) - $55.20   BUY NOW

Standard Practice for Using the Morphological Key for the Rapid Identification of Fibers for Contamination Control in Electron Devices and Microelectronics (Withdrawn 2005)

ASTM Volume 15.03 Space Simulation, Aerospace/Aircraft, Composite Materials

F71-68(1999) Publication Description:

Abstract Unavailable

International Classification for Standards (ICS)

ICS Classification Field ICS Field Sub-Group and Number
ICS-31-Electronics ICS Electronic Components-General (31.020)

ICS Related Standards

Cart Document Number Document Title
$46.00 E1250-15 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
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$62.40 E1250-88(2005) Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
$55.20 E1250-88(2000) Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
$52.00 E1854-13 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-07 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-05 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-03 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-96 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$52.00 E668-13 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$62.40 E668-10 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$62.40 E668-05 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$62.40 E668-00 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$46.00 F1190-11 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$55.20 F1190-99(2005) Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$55.20 F1190-99 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$49.20 F1190-93 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$41.00 F1263-11 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$49.20 F1263-99(2005) Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$49.20 F1263-99 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$52.00 F1467-11 Standard Guide for Use of an X-Ray Tester (10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$62.40 F1467-99(2005)e1 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$62.40 F1467-99(2005) Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$62.40 F1467-99 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits