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Standard Practices for Monitoring Non-Contact Dielectric Characterization Systems Through Use of Special Reference Wafers (Withdrawn 2003)

ASTM Volume 10.04 Electronics, Declarable Substances in Materials

F2166-02 Publication Description:

Abstract Unavailable

International Classification for Standards (ICS)

ICS Classification Field ICS Field Sub-Group and Number
ICS-19-Testing ICS Testing-Electrical (19.080)

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