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Standard Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors (Withdrawn 2003)

ASTM Volume 10.04 Electronics, Declarable Substances in Materials

F1388-92(2000) Publication Description:

Abstract Unavailable

International Classification for Standards (ICS)

ICS Classification Field ICS Field Sub-Group and Number
ICS-31-Electronics ICS Capacitors-General (31.060.01)