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Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

ASTM Volume 10.04 Electronics, Declarable Substances in Materials

F1192-00 Publication Description:

Abstract Unavailable

International Classification for Standards (ICS)

ICS Classification Field ICS Field Sub-Group and Number
ICS-31-Electronics ICS Semiconductor Devices-General (31.080.01)

ICS Related Standards

Cart Document Number Document Title
$55.20 E427-95(2006) Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)
$55.20 E427-95(2000) Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)
$46.00 E431-96(2016) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
$55.20 E431-96(2011) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
$55.20 E431-96(2007) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
$55.20 E431-96(2002) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
$55.20 E431-96 Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
$67.00 E722-14 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
$80.40 E722-09e1 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
$80.40 E722-09 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
$62.40 E722-04e2 Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
$62.40 E722-04e1 Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
$62.40 E722-04 Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
$46.00 F1190-11 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$55.20 F1190-99(2005) Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$55.20 F1190-99 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$49.20 F1190-93 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$52.00 F1192-11 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
$62.40 F1192-00(2006) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
$49.20 F1211-89(1994)e1 Standard Specification for Semiconductor Device Passivation Opening Layouts
$49.20 F1211-89(2001) Standard Specification for Semiconductor Device Passivation Opening Layouts (Withdrawn 2007)
$74.00 F1892-12 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
$80.40 F1892-06 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
$80.40 F1892-04 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
$80.40 F1892-98 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
$46.00 F1893-11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
$55.20 F1893-98(2003) Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
$55.20 F1893-98 Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
$55.20 F78-97(2002) Standard Test Method for Calibration of Helium Leak Detectors by Use of Secondary Standards (Withdrawn 2008)
$55.20 F78-97 Standard Test Method for Calibration of Helium Leak Detectors by Use of Secondary Standards