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Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

ASTM Volume 03.01 Metals - Mechanical Testing, Metallography

E766-98 Publication Description:

Abstract Unavailable

International Classification for Standards (ICS)

ICS Classification Field ICS Field Sub-Group and Number
ICS-37-Image ICS Optical Equipment (37.020)

ICS Related Standards

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$49.20 E211-82(1999)e1 Standard Specification for Cover Glasses and Glass Slides for Use in Microscopy
$46.00 E2228-10 Standard Guide for Microscopic Examination of Textile Fibers
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$46.00 E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
$55.20 E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
$55.20 E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
$55.20 E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
$49.20 E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
$49.20 E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
$49.20 E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
$55.20 F1048-87(1999) Standard Test Method for Measuring the Effective Surface Roughness of Optical Components by Total Integrated Scattering (Withdrawn 2003)
$46.00 F1863-16 Standard Test Method for Measuring the Night Vision Goggle-Weighted Transmissivity of Transparent Parts
$55.20 F1863-10 Standard Test Method for Measuring the Night Vision Goggle-Weighted Transmisivity of Transparent Parts
$55.20 F1863-98(2004) Standard Test Method for Measuring the Night Vision Goggle-Weighted Transmisivity of Transparent Parts
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$55.20 F728-81(2003) Standard Practice for Preparing An Optical Microscope for Dimensional Measurements (Withdrawn 2003)
$41.00 E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization