E1854-96 - $62.40   BUY NOW

Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

ASTM Volume 12.02 Nuclear Energy (II), Solar, and Geothermal Energy

E1854-96 Publication Description:

Abstract Unavailable

International Classification for Standards (ICS)

ICS Classification Field ICS Field Sub-Group and Number
ICS-19-Testing ICS Testing-Electrical (19.080)
ICS-31-Electronics ICS Electronic Components-General (31.020)

ICS Related Standards

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$46.00 A937/A937M-12 Standard Test Method for Determining Interlaminar Resistance of Insulating Coatings Using Two Adjacent Test Surfaces
$55.20 A937/A937M-06 Standard Test Method for Determining Interlaminar Resistance of Insulating Coatings Using Two Adjacent Test Surfaces
$55.20 A937/A937M-01 Standard Test Method for Determining Interlaminar Resistance of Insulating Coatings Using Two Adjacent Test Surfaces
$52.00 E1854-13 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-07 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-05 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-03 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$41.00 F1680-07a(2014) Standard Test Method for Determining Circuit Resistance of a Membrane Switch
$49.20 F1680-07a Standard Test Method for Determining Circuit Resistance of a Membrane Switch
$49.20 F1680-07 Standard Test Method for Determining Circuit Resistance of a Membrane Switch
$49.20 F1680-02 Standard Test Method for Determining Circuit Resistance of a Membrane Switch
$49.20 F1680-96 Standard Test Method for Determining Circuit Resistance of a Membrane Switch
$41.00 F1681-14 Standard Test Method for Determining Current Carrying Capacity of a Membrane Switch Circuit
$49.20 F1681-07a Standard Test Method for Determining Current Carrying Capacity of a Conductor as Part of a Membrane Switch Circuit
$49.20 F1681-07 Standard Test Method for Determining Current Carrying Capacity of a Conductor as Part of a Membrane Switch Circuit
$49.20 F1681-96(2002) Standard Test Method for Determining Current Carrying Capacity of a Conductor as Part of a Membrane Switch Circuit
$49.20 F1681-96 Standard Test Method for Determining Current Carrying Capacity of a Conductor as Part of a Membrane Switch Circuit
$55.20 F2166-02 Standard Practices for Monitoring Non-Contact Dielectric Characterization Systems Through Use of Special Reference Wafers (Withdrawn 2003)
$46.00 E1250-15 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
$62.40 E1250-10 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
$62.40 E1250-88(2005) Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
$55.20 E1250-88(2000) Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
$52.00 E1854-13 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-07 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-05 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-03 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$52.00 E668-13 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$62.40 E668-10 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$62.40 E668-05 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$62.40 E668-00 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$46.00 F1190-11 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$55.20 F1190-99(2005) Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$55.20 F1190-99 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$49.20 F1190-93 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$41.00 F1263-11 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$49.20 F1263-99(2005) Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$49.20 F1263-99 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$52.00 F1467-11 Standard Guide for Use of an X-Ray Tester (10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$62.40 F1467-99(2005)e1 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$62.40 F1467-99(2005) Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$62.40 F1467-99 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$55.20 F71-68(1999) Standard Practice for Using the Morphological Key for the Rapid Identification of Fibers for Contamination Control in Electron Devices and Microelectronics (Withdrawn 2005)