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Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

ASTM Volume 12.02 Nuclear Energy (II), Solar, and Geothermal Energy

E1250-88(2000) Publication Description:

Abstract Unavailable

International Classification for Standards (ICS)

ICS Classification Field ICS Field Sub-Group and Number
ICS-31-Electronics ICS Electronic Components-General (31.020)

ICS Related Standards

Cart Document Number Document Title
$46.00 E1250-15 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
$62.40 E1250-10 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
$62.40 E1250-88(2005) Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
$52.00 E1854-13 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-07 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-05 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-03 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$62.40 E1854-96 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
$52.00 E668-13 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$62.40 E668-10 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$62.40 E668-05 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$62.40 E668-00 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
$46.00 F1190-11 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$55.20 F1190-99(2005) Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$55.20 F1190-99 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$49.20 F1190-93 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
$41.00 F1263-11 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$49.20 F1263-99(2005) Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$49.20 F1263-99 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$52.00 F1467-11 Standard Guide for Use of an X-Ray Tester (10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$62.40 F1467-99(2005)e1 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$62.40 F1467-99(2005) Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$62.40 F1467-99 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
$55.20 F71-68(1999) Standard Practice for Using the Morphological Key for the Rapid Identification of Fibers for Contamination Control in Electron Devices and Microelectronics (Withdrawn 2005)